Lingjing PMD
Stereo Phase Deflection Detector
The Lingjing PMD system consists of encoded structured light and an industrial area-scan camera. Its light source projects a specific pattern onto the surface under test. By exploiting the phase of the reflected image, which is highly sensitive to minute surface variations, it employs phase unwrapping and reconstruction algorithms to achieve three-dimensional topography and defect detection.
CORE ADVANTAGE
High Speed
Using structured light measurement technology, the cycle time (CT) per measurement point is within 2 s, enabling rapid inspection.
Interference Resistance
Insensitive to longitudinal vibrations, allowing operation in demanding industrial environments.
High Sensitivity
Minimum lateral resolution of 30 μm, with nanometer-level resolution in the height direction.
High Accuracy
Delivers high-precision curvature measurement, capable of inspecting large-curvature free-form surfaces.
INDUSTRY APPLICATIONS
3C ELECTRONICS
Highly Reflective Metal Components
Highly Reflective Glass Components
Highly Reflective Painted Components
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NEW ENERGY
Metal Polished Parts
Highly Reflective Painted Parts
Painted Metal Parts
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SEMICONDUCTORS
Wafer Surfaces
Highly Reflective Target Surfaces
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OPTICAL GLASS
Optical Lens Surfaces
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